X-ray structural studies of polyethetrafluoroethylen

Abstract

X-ray diffraction studies of ultradisperse powder, ordered with the spiral structure of industrial (F-4) and modified polytetrafluoroethylene (PTFE) on different X-ray machines with different shooting conditions were performed. The obtained X-ray diffraction patterns are noticeably differed between themselves. In contrast to X-ray diffraction patterns of ultrafine powder, which has two reflexes and a modified PTFE with a single reflex, on the fluoroplastic-4 X-ray diffraction pattern, in addition to the polytetrafluoroethylene line, additional diffraction peaks (a wide diffuse halo and a series of reflections) that indicate the presence of several phases of fluoroplastic or a modification of the structure were found. The analysis of X-ray diffraction patterns showed that the standard PTFE line observed at an angle (2θ = 18.15 °) is typical for all samples. It was established that the difference in X-ray diffraction patterns is due to the prehistory of obtaining PTFE samples.