Genetic algorithm, bees algorithm and extended bees algorithm efficiency comparison for x-ray reflectogram decoding application

dc.contributor.authorGerasimenko, N.N.
dc.contributor.authorKartashov, D.A.
dc.contributor.authorMedetov, N.A.
dc.date.accessioned2019-05-14T10:42:21Z
dc.date.available2019-05-14T10:42:21Z
dc.date.issued2010-06-28
dc.description.abstractA comparison of experimental data processing with genetic algorithm, bees algorithm and extended bees algorithm was carried for data obtained with relative double wave x-ray reflectometry. Different precision ratio for film thickness interpretation was discovered when different algorithms were applied. It was found that extended bees algorithm demonstrates sufficiently higher precision compared with two other algorithms.ru_RU
dc.identifier.citationGerasimenko, N.N. Genetic algorithm, bees algorithm and extended bees algorithm efficiency comparison for x-ray reflectogram decoding application / N.N. Gerasimenko, D.A. Kartashov, N.A. Medetov // Eurasian Physical Technical Journal. – 2010. – Vol.7. – No 1(13). – P. 51-55.ru_RU
dc.identifier.issn1811-1165
dc.identifier.urihttps://rep.buketov.edu.kz//handle/data/5841
dc.language.isoenru_RU
dc.publisherYe.A.Buketov Karaganda State University Publishing houseru_RU
dc.relation.ispartofseriesEurasian Physical Technical Journal;Vol. 7 № 1(13)
dc.subjectgenetic algorithmru_RU
dc.subjectbees algorithmru_RU
dc.subjectextended bees algorithmru_RU
dc.subjectfunction variation dependingru_RU
dc.titleGenetic algorithm, bees algorithm and extended bees algorithm efficiency comparison for x-ray reflectogram decoding applicationru_RU
dc.typeArticleru_RU

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