About the possibility of the estimation of superficial potential of semiconductor films from thickness dependence of kinetic factors

Abstract

In work the expressions describing dependences of kinetic factors of carriers of a charge from a thickness of semiconductor films at certain values of superficial potential are received. The estimation of a value of superficial electrostatic potential in films p-Ge on the basis of experimental data on research of thick dependences of kinetic factors is resulted. Satisfactory conformity of values of the superficial potential received by a calculating way and from experimental data is established.